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标题描述
ASTM-E1161
Semiconductors and Electronic Components, Radiologic Examination of
ASTM-F1192
Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-M-38510/53
Microcircuits, Digital, CMOS, Complimentary Pair Plus Inverter, and-or-Select Exclusive or Gates, Expandable 8-Input Gate Monolithic Silicon
MIL-M-38510/753
Microcircuits, Digital, Advanced CMOS, Flip-Flops, Monolithic Silicon, Positive Logic
MIL-M-38510/762
Microcircuits, Digital, Advanced Cmos, Multiplexers, Monolithic Silicon, Positive Logic
MIL-M-38510/141
Microcircuits, Linear, Darlington Transistor Array, Seven and Eight Gate, Monolithic Silicon
MIL-M-38510/170
Microcircuits, Digital, CMOS, and Gates, Monolithic Silicon, Positive Logic
MIL-M-38510/175
Microcircuits, Digital, CMOS, Positive Logic, Flip-Flops and Monostable Multivibrator, Monolithic Silicon
MIL-M-38510/343
Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Binary Counters, Monolithic Silicon
MIL-M-38510/57
Microcircuits, Digital, CMOS, Static Shift Register, Monolithic Silicon, Positive Logic
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