|
描述 |
标准 |
MIL-T-38986 |
描述 |
TEST SET, WAFER AND INTEGRATED CIRCUIT, MICROELECTRONIC TTU-311/E (NO S/S DOCUMENT) |
分类归属 |
1105 |
文档状态 |
注销 |
取消日期 |
1982-10-01 |
文档类型 |
Detail Specification |
文档注释 |
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起草机构 |
DS |
编制机构 |
Directorate of Nuclear Weapons (S/S by 99) |
协调级别 |
Limited |
空军管理 |
Directorate of Nuclear Weapons (S/S by 99) |