|
描述 |
| 标准 |
MIL-S-19500 |
| 规范 |
517 |
| 涵盖范围 |
This specification covers the detail requirements for silicon, diode array. The prefix "TX" is used on devices submitted to and passing the special process-conditioning, testing, and screening as specified in 4.5.1 through 4.5.8. The prefix "TXV" is used on devices which have been subjected to and have passed the internal visual inspection specified in 4.6. |
| 描述 |
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN, JANTX, AND JANTXV (S/S BY MIL-S-19500/474) |
| 分类归属 |
5961 |
| 文档状态 |
注销 |
| 取消日期 |
1989-02-24 |
| 文档类型 |
Detail Specification |
| 文档注释 |
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| 起草机构 |
CC |
| 编制机构 |
Rome Laboratory (S/S by AF 11) |
| 协调级别 |
Limited |
| 空军管理 |
Rome Laboratory (S/S by AF 11) |
